Microsemi announces completion of 26 million device-hours of FPGA reliability testing

Data Reinforces Robustness and High Reliability of Microsemi FPGAs

Microsemi Corporation, a leading provider of semiconductor solutions differentiated by power, security, reliability and performance, today announced that an independent organization providing technical and scientific research, development and advisory services to national security space programs has completed reliability testing of Microsemi’s commercial-grade Axcelerator® FPGAs. The tests lasted more than four years with an accumulated total of more than 26 million device-hours of testing without a single antifuse failure.

Microsemi’s Axcelerator FPGAs are the commercial equivalent of Microsemi’s space-flight RTAX-S/SL FPGAs and share the same CMOS structures, antifuse technology, materials, processing, dimensions and programming attributes. The RTAX-S/SL FPGAs are also radiation-tolerant and include flip-flops protected against radiation-induced upsets by built-in triple-module redundancy (TMR).

“The rigorous independent high-performance tests and unprecedented amount of associated reliability data prove that our Axcelerator FPGAs are extremely reliable,” said Paul Ekas, vice president of Marketing for SoC products at Microsemi.

The testing process involved programming parts with a stringent design featuring excellent observability of failure mechanisms prior to the start of the tests. In addition, the tests included a combination of high temperature operating life (HTOL), low temperature operating life (LTOL) and temperature cycle tests.